List of Abbreviations¶
- DUT¶
Device under Test. A DUT is a product or system undergoing a test. The test is performed by the devices connected to the DUT. In the context of this manual the USB-SD-Mux is a considered part of the test-system and the USB-SD-Mux is intended to be inserted into the DUT.
- EMI¶
Electromagnetic Interference. EMI describes interference in systems caused by electromagnetic radiation generated by other devices or the system itself. EMI can lead to restrictions in functionality or malfunctions.
- ESD¶
Electrostatic Discharge. This event describes the sudden flow of electric charge between a charged body and an electric device. The energy released during this event can damage the electric device.